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Risk Intelligence in Big Data Era: A Review and Introduction to Special Issue

Author:
Wu, Desheng   Birge, John R.   


Journal:
IEEE Transactions on Cybernetics


Issue Date:
2016


Abstract(summary):

Risks exist in every aspect of our lives, and can mean different things to different people, while negatively in general they always cause a great deal of potential damage and inconvenience for the enterprise stakeholders. Investigation of risk analytics tools in today's big data era is beneficial to both practitioners and academic researchers from industrial systems. The current special issue provides some view of how risk-based business intelligence can be applied to industrial systems faced with big data issues.


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