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[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Controlling L-BTBT in the Ultra-short channel Nanowire Junctionless Accumulation FETs using Overlapping Gate-on- Drain

Author:
Jain, Aakash Kumar   Musalgaonkar, Gaurav   Kumar, Mamidala Jagadesh   


Issue Date:
2019


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