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Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

Author:
Novikova, N. N.  Yakovlev, V. A.  Klimin, S. A.  Malin, T. V.  Gilinsky, A. M.  Zhuravlev, K. S.  


Journal:
OPTICS AND SPECTROSCOPY


Issue Date:
2019


Abstract(summary):

The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon-phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.


Page:
36---39


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