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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

Author:
Roshko, Alexana   Brubaker, Matt D.   Blanchard, Paul T.   Bertness, Kris A.   Harvey, Todd E.   Geiss, Roy H.   Levin, Igor  


Journal:
Journal of Materials Research


Issue Date:
2017


Page:
936-946


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