Creat membership Creat membership
Sign in

Forgot password?

Confirm
  • Forgot password?
    Sign Up
  • Confirm
    Sign In
Creat membership Creat membership
Sign in

Forgot password?

Confirm
  • Forgot password?
    Sign Up
  • Confirm
    Sign In
Collection

toTop

If you have any feedback, Please follow the official account to submit feedback.

Turn on your phone and scan

home > search >

Temperature-dependent electron microscopy study of Au thin films on Si (1?0?0) with and without a native oxide layer as barrier at the interface

Author:
Rath, A   Dash, J K   Juluri, R R   Rosenauer, A   Satyam, P V  


Journal:
Journal of Physics D: Applied Physics


Issue Date:
2011


Abstract(summary):

http://stacks.iop.org/0022-3727/44/i=11/a=115301?key=crossref.56b6b6530ded64cea345bde697e2ec83


Page:
115301


Similar Literature

Submit Feedback

This function is a member function, members do not limit the number of downloads