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NVNA Techniques for Pulsed RF Measurements

Author:
Roblin, Patrick   Ko, Young   Yang, Chieh   Suh, Inwon   Doo, Seok  


Journal:
IEEE Microwave Magazine


Issue Date:
2011


Abstract(summary):

http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=5725592


Page:
65-76


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