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Charge transport and Hall effect in rubrene single-crystal transistors under high pressure

Author:
Okada, Y.   Sakai, K.   Uemura, T.   Nakazawa, Y.   Takeya, J.  


Journal:
Physical Review B


Issue Date:
2011


Abstract(summary):

http://link.aps.org/doi/10.1103/PhysRevB.84.245308


Page:
245308


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