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Noise and lifetime measurements in Si p+-i-n power diodes: P. Fang, L. He, A. D. Van Rheenen, A. van der Ziel and Q. Peng. Solid-St. Electron. 32(5), 345 (1989)

Author:
None  


Issue Date:
1990


Abstract(summary):

http://linkinghub.elsevier.com/retrieve/pii/002627149090449W


Page:
616-0


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