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Scanning electron microscopy, x-ray microanalysis and analytical electron microscopy a laboratory workbook. Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig, Jr., John T. Armstron, Patrick Echlin, Charles E. Fiori, David C. Joy, Eric Lifshin, Klaus-Ruediger Peters Plenum Press, New York (1992) ISBN: 0-306-435918; $32.50

Author:
C. Gordon Cleaver  


Issue Date:
1993


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