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Proton radiation damage experiment for X-ray SOI pixel detectors

Author:
Yarita, Keigo  Kohmura, Takayoshi  Hagino, Kouichi  Kogiso, Taku  Oono, Kenji  Negishi, Kousuke  Tamasawa, Koki  Sasaki, Akinori  Yoshiki, Satoshi  Tsuru, Takeshi Go  Tanaka, Takaaki  Matsumura, Hideaki  Tachibana, Katsuhiro  Hayashi, Hideki  Harada, Sodai  Takeda, Ayaki  Mori, Koji  Nishioka, Yusuke  Takebayashi, Nobuaki  Yokoyama, Shoma  Fukuda, Kohei  Arai, Yasuo  Miyoshi, Toshinobu  Kurachi, Ikuo  Hamano, Tsuyoshi  


Journal:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT


Issue Date:
2019


Abstract(summary):

In low earth orbit, there are many cosmic rays composed primarily of high energy protons. These cosmic rays cause surface and bulk radiation effects, resulting in degradation of detector performance. Quantitative evaluation of radiation hardness is essential in development of X-ray detectors for astronomical satellites. We performed proton irradiation experiments on newly developed X-ray detectors called XRPIX based on siliconon-insulator technology at HIMAC in National Institute of Radiological Sciences. We irradiated 6 MeV protons with a total dose of 0.5 krad, equivalent to 6 years irradiation in orbit. As a result, the gain increases by 0.2% and the energy resolution degrades by 0.5%. Finally we irradiated protons up to 20 krad and found that detector performance degraded significantly at 5 krad. With 5 krad irradiation corresponding to 60 years in orbit, the gain increases by 0.7% and the energy resolution worsens by 10%. By decomposing into noise components, we found that the increase of the circuit noise is dominant in the degradation of the energy resolution.


Page:
457---461


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