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Comparison of Se and Te clusters produced by ion bombardment

Author:
Trzyna, Malgorzata  


Journal:
INTERNATIONAL CONFERENCE ON SEMICONDUCTOR NANOSTRUCTURES FOR OPTOELECTRONICS AND BIOSENSORS (IC SENOB 2016)


Issue Date:
2017


Abstract(summary):

Nanostructures based on tellurium and selenium are materials used as components for the manufacturing topological insulators. Therefore it is crucial to precisely characterize these materials. In this work the emission of selenium and tellurium cluster ions, sputtered by Bi+ primary ion guns, was investigated by using Time-of-Flight Secondary Ion Mass Spectrometry (TOF SIMS). It has been found that BixTex and BixSex clusters appear in addition to Sex and Te-x clusters in the mass range up to similar to 1300 m/z. Local maxima or minima (magic numbers) are observed in the ion intensity versus a number of atoms per cluster for both positive and negative ions spectra for all types of clusters and primary ions used. These extrema can be attributed to different yield and stability of certain clusters but also to fragmentation of highmass clusters.


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