toTop
If you have any feedback, Please follow the official account to submit feedback.
Turn on your phone and scan
This letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: without polarization; using an open-loop dielectric charge mitigation strategy; and using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control.
If you wish to continue, please create your membership or download this.
Create MembershipThis function is a member function, members do not limit the number of downloads