NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY

Author:

XU, HAI   XIE, XIAN NING   ZILANI, M. A. K.   CHEN, WEI   WEE, ANDREW THYE SHEN  

Journal:

COSMOS

Issue Date:

2007

Abstract(summary):

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.

Page:

23-50